A Case Study of Return On Investment for Multi-sites Test Handler in The Semiconductor Industry Through Theory of Industry 4.0 ROI Relativity

Authors

  • Voon Ching Khoo Asia e University, Bulacan State University, University Technology of Malaysia

DOI:

https://doi.org/10.3991/ijes.v7i3.11057

Keywords:

Cost of Test, Testing economic model, Multi-site testing, Industry 4.0, Return on Investment Model, Big Data analysis

Abstract


The Fourth Industrial Revolution started in the year 2011 with the aim to improve productivity similar with that of the previous three industry revolutions that occurred 200 years ago. The revolutions were promoted and implemented to improve the efficiency and speed of productivity. However, Industry 4.0 is likely a supplementation of the existing approach, with the purpose to centralize the processes and factories together to be controlled by a central console. The goal is to procure productivity and manufacturing data to enable data analysis so that the industry’s �  performance affected by big data variables, namely, velocity, veracity, variety, value, and visibility are monitored and rectified for continued productivity. This research initiates the development of a theory of Industry 4.0 ROI Relativity from the economic theory of firms, incorporating the pick-and-place test equipment and Industry 4.0 variables. A case study through the experimental research approach (ERA) was conducted by measuring the effects of velocity and veracity accuracy on the good-unit per hour (UPH), profit, and return on investment (ROI) of the pick-and-place test equipment and Industry 4.0. Then, the data were analyzed with Pearson correlation coefficient to determine inter-correlations among the velocity and veracity accuracy with the UPH, profit, and ROI. This research concluded that a significant average and negative correlation exists among velocity, UPH, profit, and ROI. Furthermore, the inter-correlation analysis results show a significant average and positive correlation among veracity accuracy percentage, UPH, profit, and ROI.

Author Biography

Voon Ching Khoo, Asia e University, Bulacan State University, University Technology of Malaysia

An Engineer with Both Technical and Management Qualifications and Experiences: Khoo Voon Ching holds two Master’s degrees, namely, the M.Sc. by Research from Asia e University and a Master of Business Administration degree from Akamai University, USA. Voon Ching obtained his professional qualifications as an incorporated engineer from the Engineering Council, UK. He also studied in the University Technology of Malaysia to obtain his diploma in Mechanical Engineering and in Institute First Robotics Industrial Science to acquire an advanced diploma in Robotics and Automation Engineering. He also obtained his PhD degree from Bulacan State University. Currently he is pursue his Doctor of Engineering with University Technology of Malaysia (UTM).

Voon Ching has many years of industry experience, specializing in automation and semiconductor testing. He first worked for ASM Assembly Equipment as a service engineer before he moved to Semiconductor Testing Automation. As a sales manager with COHU, Inc., he was involved in multi-site test handler sales and service activities. He implemented multi-site testing handlers in many MNCs involved in semiconductor testing, which primarily aimed to reduce testing costs. His research interests include technology management, cost reduction through technology, and the efficiency of technology to improve human condition. Mr. Khoo is a member of the Institution of Mechanical Engineers and the International Associations of Engineers. He is a fellow of the American Academy of Project Management.

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Published

2019-09-25

How to Cite

Khoo, V. C. (2019). A Case Study of Return On Investment for Multi-sites Test Handler in The Semiconductor Industry Through Theory of Industry 4.0 ROI Relativity. International Journal of Recent Contributions from Engineering, Science & IT (iJES), 7(3), pp. 23–40. https://doi.org/10.3991/ijes.v7i3.11057

Issue

Vol. 7 No. 3 (2019)

Section

Papers

License

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